BERT - Circuit Oxide Reliability Simulator (CORS)

E. Rosenbaum, P.M. Lee, R. Moazzami, P.K. Ko and Chenming Hu

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M90/4
January 1990

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/ERL-90-4.pdf

CORS (Circuit Oxide Reliability Simulator) is a fully integrated part of BERT (BErkeley Reliability Tools). CORS projects the probability of oxide breakdown induced circuit failure as a function of operating time, temperature, power supply voltage and input waveforms. CORS can also simulate the effects of burn-in on subsequent yield and lifetime. The user is required to provide the simulator with test capacitor breakdown statistics.


BibTeX citation:

@techreport{Rosenbaum:M90/4,
    Author = {Rosenbaum, E. and Lee, P.M. and Moazzami, R. and Ko, P.K. and Hu, Chenming},
    Title = {BERT - Circuit Oxide Reliability Simulator (CORS)},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1990},
    Month = {Jan},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1386.html},
    Number = {UCB/ERL M90/4},
    Abstract = {CORS (Circuit Oxide Reliability Simulator) is a fully integrated part of BERT (BErkeley Reliability Tools). CORS projects the probability of oxide breakdown induced circuit failure as a function of operating time, temperature, power supply voltage and input waveforms. CORS can also simulate the effects of burn-in on subsequent yield and lifetime. The user is required to provide the simulator with test capacitor breakdown statistics.}
}

EndNote citation:

%0 Report
%A Rosenbaum, E.
%A Lee, P.M.
%A Moazzami, R.
%A Ko, P.K.
%A Hu, Chenming
%T BERT - Circuit Oxide Reliability Simulator (CORS)
%I EECS Department, University of California, Berkeley
%D 1990
%@ UCB/ERL M90/4
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1386.html
%F Rosenbaum:M90/4