Jae Yeon (Claire) Baek

EECS Department, University of California, Berkeley

Technical Report No. UCB/EECS-2015-215

December 1, 2015

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2015/EECS-2015-215.pdf

Advisors: Costas J. Spanos

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BibTeX citation:

@phdthesis{Baek:EECS-2015-215,
    Author= {Baek, Jae Yeon (Claire)},
    Title= {Modeling and Selection for Real-time Wafer-to-Wafer Fault Detection Applications},
    School= {EECS Department, University of California, Berkeley},
    Year= {2015},
    Month= {Dec},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2015/EECS-2015-215.html},
    Number= {UCB/EECS-2015-215},
}

EndNote citation:

%0 Thesis
%A Baek, Jae Yeon (Claire) 
%T Modeling and Selection for Real-time Wafer-to-Wafer Fault Detection Applications
%I EECS Department, University of California, Berkeley
%D 2015
%8 December 1
%@ UCB/EECS-2015-215
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2015/EECS-2015-215.html
%F Baek:EECS-2015-215