Nathan W. Cheung, Michael A. Lieberman, C.A. Pico, R.A. Stewart, J. Tao, M.H. Kiang, C. Yu, V. Vahedi, B. Troyanovsky, W. En, E. Jones and J. Benasso
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M91/116
September 1991
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1991/ERL-91-116.pdf
BibTeX citation:
@techreport{Cheung:M91/116, Author = {Cheung, Nathan W. and Lieberman, Michael A. and Pico, C.A. and Stewart, R.A. and Tao, J. and Kiang, M.H. and Yu, C. and Vahedi, V. and Troyanovsky, B. and En, W. and Jones, E. and Benasso, J.}, Title = {Plasma Immersion Ion Implantation (PIII) for Integrated Circuit Manufacturing: Fourth Quarterly Progress Report}, Institution = {EECS Department, University of California, Berkeley}, Year = {1991}, Month = {Sep}, URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1991/1911.html}, Number = {UCB/ERL M91/116} }
EndNote citation:
%0 Report %A Cheung, Nathan W. %A Lieberman, Michael A. %A Pico, C.A. %A Stewart, R.A. %A Tao, J. %A Kiang, M.H. %A Yu, C. %A Vahedi, V. %A Troyanovsky, B. %A En, W. %A Jones, E. %A Benasso, J. %T Plasma Immersion Ion Implantation (PIII) for Integrated Circuit Manufacturing: Fourth Quarterly Progress Report %I EECS Department, University of California, Berkeley %D 1991 %@ UCB/ERL M91/116 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1991/1911.html %F Cheung:M91/116