Delay Fault Coverage, Test Set Size, and Performance Tradeoffs

W.K. Lam, A. Saldanha, Robert K. Brayton and Alberto L. Sangiovanni-Vincentelli

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M92/119
October 1992

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1992/ERL-92-119.pdf

BibTeX citation:

@techreport{Lam:M92/119,
    Author = {Lam, W.K. and Saldanha, A. and Brayton, Robert K. and Sangiovanni-Vincentelli, Alberto L.},
    Title = {Delay Fault Coverage, Test Set Size, and Performance Tradeoffs},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1992},
    Month = {Oct},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1992/2195.html},
    Number = {UCB/ERL M92/119}
}

EndNote citation:

%0 Report
%A Lam, W.K.
%A Saldanha, A.
%A Brayton, Robert K.
%A Sangiovanni-Vincentelli, Alberto L.
%T Delay Fault Coverage, Test Set Size, and Performance Tradeoffs
%I EECS Department, University of California, Berkeley
%D 1992
%@ UCB/ERL M92/119
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1992/2195.html
%F Lam:M92/119