Jonathan Traupman and Robert Wilensky

EECS Department
University of California, Berkeley
Technical Report No. UCB/CSD-05-1400
July 2005

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2005/CSD-05-1400.pdf

We have developed EM-trust, a robust algorithm for evaluating reputations in peer-to-peer marketplaces. EM-trust is robust in the sense that it is far less susceptible than are previous algorithms to errors due to inaccurate feedback. Moreover, a Bayesian version of EM-trust seems ideally suited to real peer-to-peer marketplaces, in which participants are unlikely to have had previous interactions. The properties of both EM-trust variants as well as eBay's "percent positive feedback" algorithm have been evaluated in a marketplace simulator designed to model a real peer-to-peer marketplace.

BibTeX citation:

@techreport{Traupman:CSD-05-1400,
    Author = {Traupman, Jonathan and Wilensky, Robert},
    Title = {EM-trust: a Robust Reputation Algorithm for Peer-to-peer Marketplaces},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {2005},
    Month = {Jul},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2005/5448.html},
    Number = {UCB/CSD-05-1400},
    Abstract = {We have developed EM-trust, a robust algorithm for evaluating reputations in peer-to-peer marketplaces. EM-trust is robust in the sense that it is far less susceptible than are previous algorithms to errors due to inaccurate feedback. Moreover, a Bayesian version of EM-trust seems ideally suited to real peer-to-peer marketplaces, in which participants are unlikely to have had previous interactions. The properties of both EM-trust variants as well as eBay's "percent positive feedback" algorithm have been evaluated in a marketplace simulator designed to model a real peer-to-peer marketplace.}
}

EndNote citation:

%0 Report
%A Traupman, Jonathan
%A Wilensky, Robert
%T EM-trust: a Robust Reputation Algorithm for Peer-to-peer Marketplaces
%I EECS Department, University of California, Berkeley
%D 2005
%@ UCB/CSD-05-1400
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2005/5448.html
%F Traupman:CSD-05-1400