A Case For Adaptive Datacenters To Conserve Energy and Improve Reliability
Peter Bodik and Michael Paul Armbrust and Kevin Canini and Armando Fox and Michael Jordan and David A. Patterson
EECS Department, University of California, Berkeley
Technical Report No. UCB/EECS-2008-127
September 26, 2008
http://www2.eecs.berkeley.edu/Pubs/TechRpts/2008/EECS-2008-127.pdf
Although there is prior work on energy conservation in datacenters, we identify a new approach based on the synergy between virtual machines and statistical machine learning, and we observe that constrained energy conservation can improve hardware reliability. We give initial results on a cluster that reduces energy costs by a factor of 5, reduces integrated circuit failures by a factor of 1.6, and disk failures by a factor of 5. We propose research milestones to generalize our results and compare them with recent related work.
BibTeX citation:
@techreport{Bodik:EECS-2008-127, Author= {Bodik, Peter and Armbrust, Michael Paul and Canini, Kevin and Fox, Armando and Jordan, Michael and Patterson, David A.}, Title= {A Case For Adaptive Datacenters To Conserve Energy and Improve Reliability}, Year= {2008}, Month= {Sep}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2008/EECS-2008-127.html}, Number= {UCB/EECS-2008-127}, Abstract= {Although there is prior work on energy conservation in datacenters, we identify a new approach based on the synergy between virtual machines and statistical machine learning, and we observe that constrained energy conservation can improve hardware reliability. We give initial results on a cluster that reduces energy costs by a factor of 5, reduces integrated circuit failures by a factor of 1.6, and disk failures by a factor of 5. We propose research milestones to generalize our results and compare them with recent related work.}, }
EndNote citation:
%0 Report %A Bodik, Peter %A Armbrust, Michael Paul %A Canini, Kevin %A Fox, Armando %A Jordan, Michael %A Patterson, David A. %T A Case For Adaptive Datacenters To Conserve Energy and Improve Reliability %I EECS Department, University of California, Berkeley %D 2008 %8 September 26 %@ UCB/EECS-2008-127 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2008/EECS-2008-127.html %F Bodik:EECS-2008-127