Towards Automatically Checking Thousands of Failures with Micro-specifications

Haryadi S. Gunawi, Thanh Do, Pallavi Joshi, Joseph M. Hellerstein, Andrea C. Arpaci-Dusseau, Remzi H. Arpaci-Dusseau and Koushik Sen

EECS Department
University of California, Berkeley
Technical Report No. UCB/EECS-2010-98
June 16, 2010

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2010/EECS-2010-98.pdf

Recent data-loss incidents have shown that existing large distributed systems are still vulnerable to failures. To improve the situation, we propose two new testing approaches: failure testing service (FTS) and declarative testing specification (DTS). FTS enables us to systematically push a system into thousands of failure scenarios, leading us to many critical recovery bugs. With DTS, we introduce "micro-specifications", clear and concise specifications written in Datalog style, which enables developers to easily write, refine, and manage potentially hundreds of specifications.


BibTeX citation:

@techreport{Gunawi:EECS-2010-98,
    Author = {Gunawi, Haryadi S. and Do, Thanh and Joshi, Pallavi and Hellerstein, Joseph M. and Arpaci-Dusseau, Andrea C. and Arpaci-Dusseau, Remzi H. and Sen, Koushik},
    Title = {Towards Automatically Checking Thousands of Failures with Micro-specifications},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {2010},
    Month = {Jun},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2010/EECS-2010-98.html},
    Number = {UCB/EECS-2010-98},
    Abstract = {Recent data-loss incidents have shown that existing
large distributed systems are still vulnerable to
failures.  To improve the situation, we propose two
new testing approaches: failure testing service
(FTS) and declarative testing specification (DTS).
FTS enables us to systematically push a system into
thousands of failure scenarios, leading us to many
critical recovery bugs.  With DTS, we introduce
"micro-specifications", clear and concise
specifications written in Datalog style, which
enables developers to easily write, refine, and
manage potentially hundreds of specifications.}
}

EndNote citation:

%0 Report
%A Gunawi, Haryadi S.
%A Do, Thanh
%A Joshi, Pallavi
%A Hellerstein, Joseph M.
%A Arpaci-Dusseau, Andrea C.
%A Arpaci-Dusseau, Remzi H.
%A Sen, Koushik
%T Towards Automatically Checking Thousands of Failures with Micro-specifications
%I EECS Department, University of California, Berkeley
%D 2010
%8 June 16
%@ UCB/EECS-2010-98
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2010/EECS-2010-98.html
%F Gunawi:EECS-2010-98