Books

• D. Attwood and A. Sakdinawat, X-Rays and Extreme Ultraviolet Radiation: Principles and Applications, Cambridge, UK: Cambridge University Press, 2017.
• D. T. Attwood, Soft X-Rays and Extreme Ultraviolet Radiation: Principles and Applications, Cambridge; New York: Cambridge University Press, 2000.
• F. Zernike and D. T. Attwood, Eds., OSA Proceedings on Extreme Ultraviolet Lithography: Proceedings of the Topical Meeting, OSA Proceedings, Vol. 23, Washington, D.C.: Optical Society of America, 1995.
• D. T. Attwood and J. Bokor, Eds., Short Wavelength Coherent Radiation: Generation and Applications, American Institute of Physics Conference Proceedings; Optical Science and Engineering Series (No. 7), New York, NY: AIP Press, 1986.
• D. T. Attwood and B. L. Henke, Eds., Low Energy X-ray Diagnostics, American Institute of Physics Conference Proceedings, New York, NY: AIP Press, 1981.

Articles in journals or magazines

• I. A. Vartanyants, A. Singer, A. P. Mancuso, O. M. Yefanov, A. Sakdinawat, Y. Liu, E. Bang, G. J. Williams, G. Cadenazzi, B. Abbey, H. Sinn, D. T. Attwood, K. A. Nugent, E. Weckert, T. Wang, D. Zhu, B. Wu, C. Graves, A. Scherz, J. J. Turner, W. F. Schlotter, M. Messerschmidt, J. Luning, Y. Acremann, P. Heimann, D. C. Mancini, V. Joshi, J. Krzywinski, R. Soufli, M. Fernandez-Perea, S. Hau-Riege, A. G. Peele, Y. Feng, O. Krupin, S. Moeller, and W. Wurth, "Coherence Properties of Individual Femtosecond Pulses of an X-Ray Free-Electron Laser," Phys. Rev. Lett., vol. 107, no. 144801, Sep. 2011.
• A. Sakdinawat and D. T. Attwood, "Invited Paper: Nanoscale X-ray Imaging," Nature Photonics, vol. 4, no. 12, pp. 840–848, Dec. 2010.
• E. Goulielmakis, M. Schultze, M. Hofstetter, V. S. Yakovlev, J. Gagnon, M. Uiberacker, A. L. Aquila, M. Gullikson, D. Attwood, R. Kienberger, F. Krausz, and U. Kleineberg, "Single-cycle nonlinear optics," Science, vol. 320, no. 5883, pp. pp. 1614-1617, June 2008.
• D. T. Attwood, "Nanotomography comes of age," Nature, vol. 442, pp. 642-643, Aug. 2006.
• C. Chang, A. Sakdinawat, P. Fischer, E. Anderson, and D. T. Attwood, "Single-element objective lens for soft x-ray differential interference contrast microscopy," Optics Letters, vol. 31, no. 10, pp. 1564-, May 2006.
• P. Fischer, D. Kim, W. Chao, J. A. Liddle, E. H. Anderson, and D. T. Attwood, "Soft X-ray microscopy of nanomagnetism," Materials Today, vol. 9, no. 1-2, pp. 26-33, Jan. 2006.
• W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, "Soft X-ray microscopy at a spatial resolution better than 15 nm," Nature, vol. 435, pp. 1210-1213, June 2005.
• K. M. Rosfjord, Y. Liu, and D. T. Attwood, "Tunable coherent soft X-rays," IEEE J. Selected Topics in Quantum Electronics, vol. 10, no. 6, pp. 1405-1413, Nov. 2004.
• R. A. Bartels, A. Paul, H. Green, H. C. Kapteyn, M. M. Murnane, S. Backus, I. P. Christov, Y. Liu, D. T. Attwood, and C. Jacobsen, "Generation of spatially coherent light at extreme ultraviolet wavelengths," Science, vol. 297, no. 5580, pp. 376-378, July 2002.
• Y. Liu, M. Seminario, F. G. Tomasel, C. Chang, J. J. Rocca, and D. T. Attwood, "Achievement of essentially full spatial coherence in a high-average-power soft-x-ray laser," Physical Review A, vol. 63, no. 3, pp. 033802-1-5, March 2001.
• P. P. Naulleau, K. A. Goldberg, S. H. Lee, C. Chang, D. T. Attwood, and J. Bokor, "Extreme-ultraviolet phase-shifting point-diffraction interferometer: A wave-front metrology tool with subangstrom reference-wave accuracy," Applied Optics, vol. 38, no. 35, pp. 7252-7263, Dec. 1999.
• D. T. Attwood, P. Naulleau, K. A. Goldberg, E. Tejnil, C. Chang, R. Beguiristain, P. Batson, J. Bokor, E. M. Gullikson, M. Koike, H. Medecki, and J. H. Underwood, "Invited Paper: Tunable coherent radiation in the soft X-ray and extreme ultraviolet spectral regions," IEEE J. Quantum Electronics, vol. 35, no. 5, pp. 709-720, May 1999.
• D. T. Attwood, E. H. Anderson, P. J. Batson, H. R. Beguiristain, J. Bokor, K. A. Goldberg, E. M. Gullikson, K. H. Jackson, K. Nguyen, M. Koike, H. Medecki, S. Mrowka, R. E. Tackaberry, E. Tejnil, and J. H. Underwood, "At-wavelength metrologies for extreme ultraviolet lithography (in Japanese)," J. Future Electron Devices, vol. 9, no. 1, pp. 5-14, Nov. 1998.
• D. T. Attwood, "New opportunities at soft-x-ray wavelengths," Physics Today, vol. 45, no. 8, pt. 1, pp. 24-31, Aug. 1992.
• D. T. Attwood, K. Halbach, and K. Kim, "Tunable coherent X-rays," Science, vol. 228, no. 4705, pp. 1265-1272, June 1985.
• J. Underwood and D. T. Attwood, "The renaissance of x-ray optics," Physics Today, vol. 37, no. 4, pp. 44-61, April 1984.