T.E. Everhart, O.C. Wells and R.K. Matta
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M87
August 1964
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/ERL-m-87.pdf
BibTeX citation:
@techreport{Everhart:M87, Author = {Everhart, T.E. and Wells, O.C. and Matta, R.K.}, Title = {A Novel Method of Semiconductor Device Measurements}, Institution = {EECS Department, University of California, Berkeley}, Year = {1964}, Month = {Aug}, URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/28988.html}, Number = {UCB/ERL M87} }
EndNote citation:
%0 Report %A Everhart, T.E. %A Wells, O.C. %A Matta, R.K. %T A Novel Method of Semiconductor Device Measurements %I EECS Department, University of California, Berkeley %D 1964 %@ UCB/ERL M87 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/28988.html %F Everhart:M87