A Novel Method of Semiconductor Device Measurements

T.E. Everhart, O.C. Wells and R.K. Matta

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M87
August 1964

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/ERL-m-87.pdf


BibTeX citation:

@techreport{Everhart:M87,
    Author = {Everhart, T.E. and Wells, O.C. and Matta, R.K.},
    Title = {A Novel Method of Semiconductor Device Measurements},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1964},
    Month = {Aug},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/28988.html},
    Number = {UCB/ERL M87}
}

EndNote citation:

%0 Report
%A Everhart, T.E.
%A Wells, O.C.
%A Matta, R.K.
%T A Novel Method of Semiconductor Device Measurements
%I EECS Department, University of California, Berkeley
%D 1964
%@ UCB/ERL M87
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/28988.html
%F Everhart:M87