Theoretical Admittance Variation With Frequency In Insulators Having Traps Subject to Charge Injection

Richard S. Muller

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M54
April 1964

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/ERL-m-54.pdf

BibTeX citation:

@techreport{Muller:M54,
    Author = {Muller, Richard S.},
    Title = {Theoretical Admittance Variation With Frequency In Insulators Having Traps Subject to Charge Injection},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1964},
    Month = {Apr},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/29032.html},
    Number = {UCB/ERL M54}
}

EndNote citation:

%0 Report
%A Muller, Richard S.
%T Theoretical Admittance Variation With Frequency In Insulators Having Traps Subject to Charge Injection
%I EECS Department, University of California, Berkeley
%D 1964
%@ UCB/ERL M54
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/29032.html
%F Muller:M54