Theoretical Admittance Variation With Frequency In Insulators Having Traps Subject to Charge Injection
Richard S. Muller
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M54
, 1964
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/ERL-m-54.pdf
BibTeX citation:
@techreport{Muller:M54, Author= {Muller, Richard S.}, Title= {Theoretical Admittance Variation With Frequency In Insulators Having Traps Subject to Charge Injection}, Year= {1964}, Month= {Apr}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/29032.html}, Number= {UCB/ERL M54}, }
EndNote citation:
%0 Report %A Muller, Richard S. %T Theoretical Admittance Variation With Frequency In Insulators Having Traps Subject to Charge Injection %I EECS Department, University of California, Berkeley %D 1964 %@ UCB/ERL M54 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/29032.html %F Muller:M54