T.E. Everhart and O.C. Wells and R.K. Matta

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M55

, 1964

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/ERL-m-55.pdf

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BibTeX citation:

@techreport{Everhart:M55,
    Author= {Everhart, T.E. and Wells, O.C. and Matta, R.K.},
    Title= {A Novel Method of Semiconductor Device Measurements},
    Year= {1964},
    Month= {Feb},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/29033.html},
    Number= {UCB/ERL M55},
}

EndNote citation:

%0 Report
%A Everhart, T.E. 
%A Wells, O.C. 
%A Matta, R.K. 
%T A Novel Method of Semiconductor Device Measurements
%I EECS Department, University of California, Berkeley
%D 1964
%@ UCB/ERL M55
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1964/29033.html
%F Everhart:M55