Direct Measurement of the Depletion Layer Width Variation vs. Applied Bias for a Pin Junction

N.C. MacDonald and T.E. Everhart

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M130
October 1965

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1965/ERL-m-130.pdf

BibTeX citation:

@techreport{MacDonald:M130,
    Author = {MacDonald, N.C. and Everhart, T.E.},
    Title = {Direct Measurement of the Depletion Layer Width Variation vs. Applied Bias for a Pin Junction},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1965},
    Month = {Oct},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1965/28385.html},
    Number = {UCB/ERL M130}
}

EndNote citation:

%0 Report
%A MacDonald, N.C.
%A Everhart, T.E.
%T Direct Measurement of the Depletion Layer Width Variation vs. Applied Bias for a Pin Junction
%I EECS Department, University of California, Berkeley
%D 1965
%@ UCB/ERL M130
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1965/28385.html
%F MacDonald:M130