N.C. MacDonald and T.E. Everhart

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M130

, 1965

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1965/ERL-m-130.pdf

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BibTeX citation:

@techreport{MacDonald:M130,
    Author= {MacDonald, N.C. and Everhart, T.E.},
    Title= {Direct Measurement of the Depletion Layer Width Variation vs. Applied Bias for a Pin Junction},
    Year= {1965},
    Month= {Oct},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1965/28385.html},
    Number= {UCB/ERL M130},
}

EndNote citation:

%0 Report
%A MacDonald, N.C. 
%A Everhart, T.E. 
%T Direct Measurement of the Depletion Layer Width Variation vs. Applied Bias for a Pin Junction
%I EECS Department, University of California, Berkeley
%D 1965
%@ UCB/ERL M130
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1965/28385.html
%F MacDonald:M130