Analysis of Backscattered Electron Signals for X-ray Mask Inspection
Michael G. Rosenfield
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M84/16
, 1984
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/ERL-m-84-16.pdf
Advisors: Andrew R. Neureuther
BibTeX citation:
@phdthesis{Rosenfield:M84/16, Author= {Rosenfield, Michael G.}, Title= {Analysis of Backscattered Electron Signals for X-ray Mask Inspection}, School= {EECS Department, University of California, Berkeley}, Year= {1984}, Month= {Jan}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/270.html}, Number= {UCB/ERL M84/16}, }
EndNote citation:
%0 Thesis %A Rosenfield, Michael G. %T Analysis of Backscattered Electron Signals for X-ray Mask Inspection %I EECS Department, University of California, Berkeley %D 1984 %@ UCB/ERL M84/16 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/270.html %F Rosenfield:M84/16