A Fully Automated MOS Device Characterization System for Process- Oriented Integrated Circuit Design
B.S. Messenger
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M84/18
, 1984
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/ERL-m-84-18.pdf
BibTeX citation:
@techreport{Messenger:M84/18, Author= {Messenger, B.S.}, Title= {A Fully Automated MOS Device Characterization System for Process- Oriented Integrated Circuit Design}, Year= {1984}, Month= {Jan}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/272.html}, Number= {UCB/ERL M84/18}, }
EndNote citation:
%0 Report %A Messenger, B.S. %T A Fully Automated MOS Device Characterization System for Process- Oriented Integrated Circuit Design %I EECS Department, University of California, Berkeley %D 1984 %@ UCB/ERL M84/18 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/272.html %F Messenger:M84/18