William G. Oldham and Andrew R. Neureuther and Y. Shacham

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M84/26

, 1984

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/ERL-m-84-26.pdf

---

BibTeX citation:

@techreport{Oldham:M84/26,
    Author= {Oldham, William G. and Neureuther, Andrew R. and Shacham, Y.},
    Title= {Berkeley CMOS Process Test Patterns},
    Year= {1984},
    Month= {Mar},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/287.html},
    Number= {UCB/ERL M84/26},
}

EndNote citation:

%0 Report
%A Oldham, William G. 
%A Neureuther, Andrew R. 
%A Shacham, Y. 
%T Berkeley CMOS Process Test Patterns
%I EECS Department, University of California, Berkeley
%D 1984
%@ UCB/ERL M84/26
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/287.html
%F Oldham:M84/26