Current, Field Stress-Induced Degradation in Thin Gate-Oxide MOSFETs
Mong-Song Liang
EECS Department, University of California, Berkeley
1984
Advisors: Chenming Hu
BibTeX citation:
@phdthesis{Liang:7650, Author= {Liang, Mong-Song}, Title= {Current, Field Stress-Induced Degradation in Thin Gate-Oxide MOSFETs}, School= {EECS Department, University of California, Berkeley}, Year= {1984}, }
EndNote citation:
%0 Thesis %A Liang, Mong-Song %T Current, Field Stress-Induced Degradation in Thin Gate-Oxide MOSFETs %I EECS Department, University of California, Berkeley %D 1984 %F Liang:7650