D. Riley and Alberto Sangiovanni-Vincentelli

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M85/58

1985

This publication is archived. It is kept only for reference purposes, so it is no longer being updated and may not meet accessibility standards. If you need this content in a different format, please email webteam@eecs.berkeley.edu.

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1985/Archive/ERL-85-58.pdf


BibTeX citation:

@techreport{Riley:M85/58,
    Author= {Riley, D. and Sangiovanni-Vincentelli, Alberto},
    Title= {A New Profit Maximization Methodology for Statistical Design of Integrated Circuits Part I: Problem Formulation},
    Year= {1985},
    Month= {May},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1985/535.html},
    Number= {UCB/ERL M85/58},
}

EndNote citation:

%0 Report
%A Riley, D. 
%A Sangiovanni-Vincentelli, Alberto 
%T A New Profit Maximization Methodology for Statistical Design of Integrated Circuits Part I: Problem Formulation
%I EECS Department, University of California, Berkeley
%D 1985
%@ UCB/ERL M85/58
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1985/535.html
%F Riley:M85/58