A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System
N. Yuen
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M86/41
, 1986
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1986/ERL-86-41.pdf
BibTeX citation:
@techreport{Yuen:M86/41, Author= {Yuen, N.}, Title= {A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System}, Year= {1986}, Month= {Apr}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1986/694.html}, Number= {UCB/ERL M86/41}, }
EndNote citation:
%0 Report %A Yuen, N. %T A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System %I EECS Department, University of California, Berkeley %D 1986 %@ UCB/ERL M86/41 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1986/694.html %F Yuen:M86/41