A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System

N. Yuen

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M86/41

1986

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http://www2.eecs.berkeley.edu/Pubs/TechRpts/1986/Archive/ERL-86-41.pdf

BibTeX citation:

@techreport{Yuen:M86/41,
    Author= {Yuen, N.},
    Title= {A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System},
    Year= {1986},
    Month= {Apr},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1986/694.html},
    Number= {UCB/ERL M86/41},
}

EndNote citation:

%0 Report
%A Yuen, N. 
%T A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System
%I EECS Department, University of California, Berkeley
%D 1986
%@ UCB/ERL M86/41
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1986/694.html
%F Yuen:M86/41