Test Generation for Sequential Finite State Machines
H-K. T. Ma and S. Devadas and A. Richard Newton and Alberto L. Sangiovanni-Vincentelli
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M87/36
, 1987
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1987/ERL-87-36.pdf
BibTeX citation:
@techreport{Ma:M87/36, Author= {Ma, H-K. T. and Devadas, S. and Newton, A. Richard and Sangiovanni-Vincentelli, Alberto L.}, Title= {Test Generation for Sequential Finite State Machines}, Year= {1987}, Month= {May}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1987/887.html}, Number= {UCB/ERL M87/36}, }
EndNote citation:
%0 Report %A Ma, H-K. T. %A Devadas, S. %A Newton, A. Richard %A Sangiovanni-Vincentelli, Alberto L. %T Test Generation for Sequential Finite State Machines %I EECS Department, University of California, Berkeley %D 1987 %@ UCB/ERL M87/36 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1987/887.html %F Ma:M87/36