Implementation of the BSIM Substrate Current and Degradation Models in SCALP

M.M. Kuo, K. Seki, P.M. Lee, P.K. Ko and Chenming Hu

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M87/39
June 1987

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1987/ERL-87-39.pdf

BibTeX citation:

@techreport{Kuo:M87/39,
    Author = {Kuo, M.M. and Seki, K. and Lee, P.M. and Ko, P.K. and Hu, Chenming},
    Title = {Implementation of the BSIM Substrate Current and Degradation Models in SCALP},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1987},
    Month = {Jun},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1987/895.html},
    Number = {UCB/ERL M87/39}
}

EndNote citation:

%0 Report
%A Kuo, M.M.
%A Seki, K.
%A Lee, P.M.
%A Ko, P.K.
%A Hu, Chenming
%T Implementation of the BSIM Substrate Current and Degradation Models in SCALP
%I EECS Department, University of California, Berkeley
%D 1987
%@ UCB/ERL M87/39
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1987/895.html
%F Kuo:M87/39