Implementation of the BSIM Substrate Current and Degradation Models in SCALP
M.M. Kuo and K. Seki and P.M. Lee and P.K. Ko and Chenming Hu
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M87/39
, 1987
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1987/ERL-87-39.pdf
BibTeX citation:
@techreport{Kuo:M87/39, Author= {Kuo, M.M. and Seki, K. and Lee, P.M. and Ko, P.K. and Hu, Chenming}, Title= {Implementation of the BSIM Substrate Current and Degradation Models in SCALP}, Year= {1987}, Month= {Jun}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1987/895.html}, Number= {UCB/ERL M87/39}, }
EndNote citation:
%0 Report %A Kuo, M.M. %A Seki, K. %A Lee, P.M. %A Ko, P.K. %A Hu, Chenming %T Implementation of the BSIM Substrate Current and Degradation Models in SCALP %I EECS Department, University of California, Berkeley %D 1987 %@ UCB/ERL M87/39 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1987/895.html %F Kuo:M87/39