N.N.S. Tam
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M88/32
May 1988
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1988/ERL-88-32.pdf
BibTeX citation:
@techreport{Tam:M88/32, Author = {Tam, N.N.S.}, Title = {Characterization of Electron-Beam-Exposed Negative Resists}, Institution = {EECS Department, University of California, Berkeley}, Year = {1988}, Month = {May}, URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1988/1039.html}, Number = {UCB/ERL M88/32} }
EndNote citation:
%0 Report %A Tam, N.N.S. %T Characterization of Electron-Beam-Exposed Negative Resists %I EECS Department, University of California, Berkeley %D 1988 %@ UCB/ERL M88/32 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1988/1039.html %F Tam:M88/32