P.M. Lee and M.M. Kuo and P.K. Ko and Chenming Hu

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M90/2

, 1990

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/ERL-90-2.pdf

A Circuit Aging Simulator (CAS) has been developed as part of the Berkeley Reliability Tools (BERT) to predict the effects of hot-electron degradation on circuit behavior. Using the SPICE2 or SPICE3 circuit simulator, CAS simulates circuit behavior at a user-specified future time point using fresh and pre-stressed model parameter files. CAS is configured in a pre- and post-processor configuration so that no modifications to the SPICE code is necessary. An accompanying UNIX shell script has been developed for user-friendliness and automation so that iterative simulation can easily be done to take into account the effects of on-going degradation.

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BibTeX citation:

@techreport{Lee:M90/2,
    Author= {Lee, P.M. and Kuo, M.M. and Ko, P.K. and Hu, Chenming},
    Title= {BERT - Circuit Aging Simulator (CAS)},
    Year= {1990},
    Month= {Jan},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1378.html},
    Number= {UCB/ERL M90/2},
    Abstract= {A Circuit Aging Simulator (CAS) has been developed as part of the Berkeley Reliability Tools (BERT) to predict the effects of hot-electron degradation on circuit behavior.  Using the SPICE2 or SPICE3 circuit simulator, CAS simulates circuit behavior at a user-specified future time point using fresh and pre-stressed model parameter files.  CAS is configured in a pre- and post-processor configuration so that no modifications to the SPICE code is necessary. An accompanying UNIX shell script has been developed for user-friendliness and automation so that iterative simulation can easily be done to take into account the effects of on-going degradation.},
}

EndNote citation:

%0 Report
%A Lee, P.M. 
%A Kuo, M.M. 
%A Ko, P.K. 
%A Hu, Chenming 
%T BERT - Circuit Aging Simulator (CAS)
%I EECS Department, University of California, Berkeley
%D 1990
%@ UCB/ERL M90/2
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1378.html
%F Lee:M90/2