E. Rosenbaum and P.M. Lee and R. Moazzami and P.K. Ko and Chenming Hu

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M90/4

, 1990

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/ERL-90-4.pdf

CORS (Circuit Oxide Reliability Simulator) is a fully integrated part of BERT (BErkeley Reliability Tools). CORS projects the probability of oxide breakdown induced circuit failure as a function of operating time, temperature, power supply voltage and input waveforms. CORS can also simulate the effects of burn-in on subsequent yield and lifetime. The user is required to provide the simulator with test capacitor breakdown statistics.

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BibTeX citation:

@techreport{Rosenbaum:M90/4,
    Author= {Rosenbaum, E. and Lee, P.M. and Moazzami, R. and Ko, P.K. and Hu, Chenming},
    Title= {BERT - Circuit Oxide Reliability Simulator (CORS)},
    Year= {1990},
    Month= {Jan},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1386.html},
    Number= {UCB/ERL M90/4},
    Abstract= {CORS (Circuit Oxide Reliability Simulator) is a fully integrated part of BERT (BErkeley Reliability Tools). CORS projects the probability of oxide breakdown induced circuit failure as a function of operating time, temperature, power supply voltage and input waveforms. CORS can also simulate the effects of burn-in on subsequent yield and lifetime. The user is required to provide the simulator with test capacitor breakdown statistics.},
}

EndNote citation:

%0 Report
%A Rosenbaum, E. 
%A Lee, P.M. 
%A Moazzami, R. 
%A Ko, P.K. 
%A Hu, Chenming 
%T BERT - Circuit Oxide Reliability Simulator (CORS)
%I EECS Department, University of California, Berkeley
%D 1990
%@ UCB/ERL M90/4
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1386.html
%F Rosenbaum:M90/4