BERT - Circuit Oxide Reliability Simulator (CORS)
E. Rosenbaum and P.M. Lee and R. Moazzami and P.K. Ko and Chenming Hu
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M90/4
1990
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http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/Archive/ERL-90-4.pdf
CORS (Circuit Oxide Reliability Simulator) is a fully integrated part of BERT (BErkeley Reliability Tools). CORS projects the probability of oxide breakdown induced circuit failure as a function of operating time, temperature, power supply voltage and input waveforms. CORS can also simulate the effects of burn-in on subsequent yield and lifetime. The user is required to provide the simulator with test capacitor breakdown statistics.
BibTeX citation:
@techreport{Rosenbaum:M90/4,
Author= {Rosenbaum, E. and Lee, P.M. and Moazzami, R. and Ko, P.K. and Hu, Chenming},
Title= {BERT - Circuit Oxide Reliability Simulator (CORS)},
Year= {1990},
Month= {Jan},
Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1386.html},
Number= {UCB/ERL M90/4},
Abstract= {CORS (Circuit Oxide Reliability Simulator) is a fully integrated part of BERT (BErkeley Reliability Tools). CORS projects the probability of oxide breakdown induced circuit failure as a function of operating time, temperature, power supply voltage and input waveforms. CORS can also simulate the effects of burn-in on subsequent yield and lifetime. The user is required to provide the simulator with test capacitor breakdown statistics.},
}
EndNote citation:
%0 Report %A Rosenbaum, E. %A Lee, P.M. %A Moazzami, R. %A Ko, P.K. %A Hu, Chenming %T BERT - Circuit Oxide Reliability Simulator (CORS) %I EECS Department, University of California, Berkeley %D 1990 %@ UCB/ERL M90/4 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1386.html %F Rosenbaum:M90/4