D.L. Flamm
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M90/41
May 1990
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/ERL-90-41.pdf
Silicon can be etched in fluorine- and chlorine- containing plasmas in many ways. This article discusses some of the basic chemical and physical phenomena which play a role and more complicated interactions and side effects found in commercial process equipment.
BibTeX citation:
@techreport{Flamm:M90/41, Author = {Flamm, D.L.}, Title = {Mechanisms of Silicon Etching in Fluorine- and Chlorine-Containing Plasmas}, Institution = {EECS Department, University of California, Berkeley}, Year = {1990}, Month = {May}, URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1487.html}, Number = {UCB/ERL M90/41}, Abstract = {Silicon can be etched in fluorine- and chlorine- containing plasmas in many ways. This article discusses some of the basic chemical and physical phenomena which play a role and more complicated interactions and side effects found in commercial process equipment.} }
EndNote citation:
%0 Report %A Flamm, D.L. %T Mechanisms of Silicon Etching in Fluorine- and Chlorine-Containing Plasmas %I EECS Department, University of California, Berkeley %D 1990 %@ UCB/ERL M90/41 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1487.html %F Flamm:M90/41