An Inversion-Layer Mobility Model for CODECS
D.A. Gates
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M90/96
1990
This publication is archived. It is kept only for reference purposes, so it is no longer being updated and may not meet accessibility standards. If you need this content in a different format, please email webteam@eecs.berkeley.edu.
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/Archive/ERL-90-96.pdf
Inversion-layer mobility in MOS transistor channels has been investigated in order to improve its modelling in the CODECS mixed-level circuit and device simulator. Several scattering mechanisms that affect this mobility are reviewed. The inversion-layer mobility can be modelled by its dependencies on the normal and lateral components of the electric field in the channel. Based on this approach, an inversion-layer-specific mobility model has been added to CODECS. A new empirical relation is used to describe the normal-field dependence of the mobility. The new expression has been tested by comparison to experimental data. The accuracy of simulation of MOSFET I(DS)-V(GS) characteristics in the linear region is improved by the new model.
BibTeX citation:
@techreport{Gates:M90/96,
Author= {Gates, D.A.},
Title= {An Inversion-Layer Mobility Model for CODECS},
Year= {1990},
Month= {Oct},
Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1611.html},
Number= {UCB/ERL M90/96},
Abstract= {Inversion-layer mobility in MOS transistor channels has been
investigated in order to improve its modelling in the CODECS
mixed-level circuit and device simulator. Several scattering
mechanisms that affect this mobility are reviewed. The
inversion-layer mobility can be modelled by its dependencies
on the normal and lateral components of the electric field in
the channel. Based on this approach, an inversion-layer-specific
mobility model has been added to CODECS. A new empirical relation is
used to describe the normal-field dependence of the mobility. The new
expression has been tested by comparison to experimental data. The
accuracy of simulation of MOSFET I(DS)-V(GS) characteristics in the
linear region is improved by the new model.},
}
EndNote citation:
%0 Report %A Gates, D.A. %T An Inversion-Layer Mobility Model for CODECS %I EECS Department, University of California, Berkeley %D 1990 %@ UCB/ERL M90/96 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1990/1611.html %F Gates:M90/96