Delay Fault Coverage, Test Set Size, and Performance Tradeoffs

W.K. Lam and A. Saldanha and Robert K. Brayton and Alberto L. Sangiovanni-Vincentelli

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M92/119

1992

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http://www2.eecs.berkeley.edu/Pubs/TechRpts/1992/Archive/ERL-92-119.pdf

BibTeX citation:

@techreport{Lam:M92/119,
    Author= {Lam, W.K. and Saldanha, A. and Brayton, Robert K. and Sangiovanni-Vincentelli, Alberto L.},
    Title= {Delay Fault Coverage, Test Set Size, and Performance Tradeoffs},
    Year= {1992},
    Month= {Oct},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1992/2195.html},
    Number= {UCB/ERL M92/119},
}

EndNote citation:

%0 Report
%A Lam, W.K. 
%A Saldanha, A. 
%A Brayton, Robert K. 
%A Sangiovanni-Vincentelli, Alberto L. 
%T Delay Fault Coverage, Test Set Size, and Performance Tradeoffs
%I EECS Department, University of California, Berkeley
%D 1992
%@ UCB/ERL M92/119
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1992/2195.html
%F Lam:M92/119