Delay Fault Coverage, Test Set Size, and Performance Tradeoffs
W.K. Lam and A. Saldanha and Robert K. Brayton and Alberto L. Sangiovanni-Vincentelli
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M92/119
, 1992
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1992/ERL-92-119.pdf
BibTeX citation:
@techreport{Lam:M92/119, Author= {Lam, W.K. and Saldanha, A. and Brayton, Robert K. and Sangiovanni-Vincentelli, Alberto L.}, Title= {Delay Fault Coverage, Test Set Size, and Performance Tradeoffs}, Year= {1992}, Month= {Oct}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1992/2195.html}, Number= {UCB/ERL M92/119}, }
EndNote citation:
%0 Report %A Lam, W.K. %A Saldanha, A. %A Brayton, Robert K. %A Sangiovanni-Vincentelli, Alberto L. %T Delay Fault Coverage, Test Set Size, and Performance Tradeoffs %I EECS Department, University of California, Berkeley %D 1992 %@ UCB/ERL M92/119 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1992/2195.html %F Lam:M92/119