Electrical Testing of A CMOS Baseline Process
D. Rodriguez
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M94/63
, 1994
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1994/ERL-94-63.pdf
BibTeX citation:
@techreport{Rodriguez:M94/63, Author= {Rodriguez, D.}, Title= {Electrical Testing of A CMOS Baseline Process}, Year= {1994}, Month= {Aug}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1994/2608.html}, Number= {UCB/ERL M94/63}, }
EndNote citation:
%0 Report %A Rodriguez, D. %T Electrical Testing of A CMOS Baseline Process %I EECS Department, University of California, Berkeley %D 1994 %@ UCB/ERL M94/63 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1994/2608.html %F Rodriguez:M94/63