A Qualitative Modeling Framework of Semiconductor Manufacturing Processes: Self-Learning Fuzzy Inference System and the Statistical Analysis of Categorical Data
Raymond L. Chen
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M95/6
, 1995
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1995/ERL-95-6.pdf
Advisors: Costas J. Spanos
BibTeX citation:
@phdthesis{Chen:M95/6, Author= {Chen, Raymond L.}, Title= {A Qualitative Modeling Framework of Semiconductor Manufacturing Processes: Self-Learning Fuzzy Inference System and the Statistical Analysis of Categorical Data}, School= {EECS Department, University of California, Berkeley}, Year= {1995}, Month= {Jan}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1995/2709.html}, Number= {UCB/ERL M95/6}, }
EndNote citation:
%0 Thesis %A Chen, Raymond L. %T A Qualitative Modeling Framework of Semiconductor Manufacturing Processes: Self-Learning Fuzzy Inference System and the Statistical Analysis of Categorical Data %I EECS Department, University of California, Berkeley %D 1995 %@ UCB/ERL M95/6 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1995/2709.html %F Chen:M95/6