Rapid Current Transition in a Crossed-Field Diode

J.P. Verboncoeur and Charles K. (Ned) Birdsall

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M95/55

1995

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http://www2.eecs.berkeley.edu/Pubs/TechRpts/1995/Archive/ERL-95-55.pdf

The transmitted current in a crossed-field gap has been characterized analytically by a number of authors [1], [4], [6] and [7]. Using a one dimensional PIC simulation, PDP1 [9], we explore the behavior of the crossed-field diode at B = B[Hull]. For mono-energetic (cold) emission, a rapid reduction of transmitted current is observed when the injected current exceeds the critical current by just 1%. Addition of a small electron temperature normal to the cathode eliminates the transition, even for kT/V~10[to the minus-5] (V = 10kV, gap = 1 cm, B = 337G, J = 1.69 A/cm[squared]), while an isotropic velocity distribution accelerates the transition.

BibTeX citation:

@techreport{Verboncoeur:M95/55,
    Author= {Verboncoeur, J.P. and Birdsall, Charles K. (Ned)},
    Title= {Rapid Current Transition in a Crossed-Field Diode},
    Year= {1995},
    Month= {Jun},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1995/2814.html},
    Number= {UCB/ERL M95/55},
    Abstract= {The transmitted current in a crossed-field gap has been characterized analytically by a number of authors [1], [4], [6] and [7]. Using a one dimensional PIC simulation, PDP1 [9], we explore the behavior of the crossed-field diode at B = B[Hull]. For mono-energetic (cold) emission, a rapid reduction of transmitted current is observed when the injected current exceeds the critical current by just 1%. Addition of a small electron temperature normal to the cathode eliminates the transition, even for kT/V~10[to the minus-5] (V = 10kV, gap = 1 cm, B = 337G, J = 1.69 A/cm[squared]), while an isotropic velocity distribution accelerates the transition.},
}

EndNote citation:

%0 Report
%A Verboncoeur, J.P. 
%A Birdsall, Charles K. (Ned) 
%T Rapid Current Transition in a Crossed-Field Diode
%I EECS Department, University of California, Berkeley
%D 1995
%@ UCB/ERL M95/55
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1995/2814.html
%F Verboncoeur:M95/55