Resist Studies for TCAD Modeling 1. Negative Resist Corner Rounding
P.I. Hagouel
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M95/72
1995
This publication is archived. It is kept only for reference purposes, so it is no longer being updated and may not meet accessibility standards. If you need this content in a different format, please email webteam@eecs.berkeley.edu.
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1995/Archive/ERL-95-72.pdf
BibTeX citation:
@techreport{Hagouel:M95/72,
Author= {Hagouel, P.I.},
Title= {Resist Studies for TCAD Modeling 1. Negative Resist Corner Rounding},
Year= {1995},
Month= {Aug},
Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1995/2858.html},
Number= {UCB/ERL M95/72},
}
EndNote citation:
%0 Report %A Hagouel, P.I. %T Resist Studies for TCAD Modeling 1. Negative Resist Corner Rounding %I EECS Department, University of California, Berkeley %D 1995 %@ UCB/ERL M95/72 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1995/2858.html %F Hagouel:M95/72