Modeling and Characterization of Electromigration Failures in IC Metallization Systems and Copper Metallization for ULSI Application
Jiang Tao
EECS Department, University of California, Berkeley
1995
Advisors: Chenming Hu
BibTeX citation:
@phdthesis{Tao:7947, Author= {Tao, Jiang}, Title= {Modeling and Characterization of Electromigration Failures in IC Metallization Systems and Copper Metallization for ULSI Application}, School= {EECS Department, University of California, Berkeley}, Year= {1995}, }
EndNote citation:
%0 Thesis %A Tao, Jiang %T Modeling and Characterization of Electromigration Failures in IC Metallization Systems and Copper Metallization for ULSI Application %I EECS Department, University of California, Berkeley %D 1995 %F Tao:7947