VLSI Gate Oxide Reliability
Chih-chieh King
EECS Department, University of California, Berkeley
1996
Advisors: Chenming Hu
BibTeX citation:
@phdthesis{King:7971, Author= {King, Chih-chieh}, Title= {VLSI Gate Oxide Reliability}, School= {EECS Department, University of California, Berkeley}, Year= {1996}, }
EndNote citation:
%0 Thesis %A King, Chih-chieh %T VLSI Gate Oxide Reliability %I EECS Department, University of California, Berkeley %D 1996 %F King:7971