Study of Interconnect Variation on Circuit Performance
Z. Lin
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M97/80
, 1997
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/ERL-97-80.pdf
BibTeX citation:
@techreport{Lin:M97/80, Author= {Lin, Z.}, Title= {Study of Interconnect Variation on Circuit Performance}, Year= {1997}, Month= {Oct}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/3327.html}, Number= {UCB/ERL M97/80}, }
EndNote citation:
%0 Report %A Lin, Z. %T Study of Interconnect Variation on Circuit Performance %I EECS Department, University of California, Berkeley %D 1997 %@ UCB/ERL M97/80 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/3327.html %F Lin:M97/80