Study of Interconnect Variation on Circuit Performance

Z. Lin

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M97/80

1997

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http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/Archive/ERL-97-80.pdf

BibTeX citation:

@techreport{Lin:M97/80,
    Author= {Lin, Z.},
    Title= {Study of Interconnect Variation on Circuit Performance},
    Year= {1997},
    Month= {Oct},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/3327.html},
    Number= {UCB/ERL M97/80},
}

EndNote citation:

%0 Report
%A Lin, Z. 
%T Study of Interconnect Variation on Circuit Performance
%I EECS Department, University of California, Berkeley
%D 1997
%@ UCB/ERL M97/80
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/3327.html
%F Lin:M97/80