A Framework for Robust Measurement-Based Admission Control

M. Grossglauser and David Tse

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M98/17
April 1998

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1998/ERL-98-17.pdf

BibTeX citation:

@techreport{Grossglauser:M98/17,
    Author = {Grossglauser, M. and Tse, David},
    Title = {A Framework for Robust Measurement-Based Admission Control},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1998},
    Month = {Apr},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1998/3406.html},
    Number = {UCB/ERL M98/17}
}

EndNote citation:

%0 Report
%A Grossglauser, M.
%A Tse, David
%T A Framework for Robust Measurement-Based Admission Control
%I EECS Department, University of California, Berkeley
%D 1998
%@ UCB/ERL M98/17
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1998/3406.html
%F Grossglauser:M98/17