M. Grossglauser and David Tse

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M98/17

, 1998

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1998/ERL-98-17.pdf

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BibTeX citation:

@techreport{Grossglauser:M98/17,
    Author= {Grossglauser, M. and Tse, David},
    Title= {A Framework for Robust Measurement-Based Admission Control},
    Year= {1998},
    Month= {Apr},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1998/3406.html},
    Number= {UCB/ERL M98/17},
}

EndNote citation:

%0 Report
%A Grossglauser, M. 
%A Tse, David 
%T A Framework for Robust Measurement-Based Admission Control
%I EECS Department, University of California, Berkeley
%D 1998
%@ UCB/ERL M98/17
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1998/3406.html
%F Grossglauser:M98/17