Hot-Carrier Reliability of CMOS Integrated Circuits
Jone F. Chen
EECS Department, University of California, Berkeley
1998
Advisors: Chenming Hu
BibTeX citation:
@phdthesis{Chen:8057, Author= {Chen, Jone F.}, Title= {Hot-Carrier Reliability of CMOS Integrated Circuits}, School= {EECS Department, University of California, Berkeley}, Year= {1998}, }
EndNote citation:
%0 Thesis %A Chen, Jone F. %T Hot-Carrier Reliability of CMOS Integrated Circuits %I EECS Department, University of California, Berkeley %D 1998 %F Chen:8057