Kaustav Banerjee

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M99/48

, 1999

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1999/ERL-99-48.pdf

Advisors: Chenming Hu

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BibTeX citation:

@phdthesis{Banerjee:M99/48,
    Author= {Banerjee, Kaustav},
    Title= {Thermal Effects in Deep Sub-Micron VLSI Interconnects and Implications for Reliability and Performance},
    School= {EECS Department, University of California, Berkeley},
    Year= {1999},
    Month= {Sep},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1999/3739.html},
    Number= {UCB/ERL M99/48},
}

EndNote citation:

%0 Thesis
%A Banerjee, Kaustav 
%T Thermal Effects in Deep Sub-Micron VLSI Interconnects and Implications for Reliability and Performance
%I EECS Department, University of California, Berkeley
%D 1999
%@ UCB/ERL M99/48
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1999/3739.html
%F Banerjee:M99/48