Thermal Effects in Deep Sub-Micron VLSI Interconnects and Implications for Reliability and Performance

Kaustav Banerjee

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M99/48
September 1999

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1999/ERL-99-48.pdf

Advisor: Chenming Hu

BibTeX citation:

@phdthesis{Banerjee:M99/48,
    Author = {Banerjee, Kaustav},
    Title = {Thermal Effects in Deep Sub-Micron VLSI Interconnects and Implications for Reliability and Performance},
    School = {EECS Department, University of California, Berkeley},
    Year = {1999},
    Month = {Sep},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1999/3739.html},
    Number = {UCB/ERL M99/48}
}

EndNote citation:

%0 Thesis
%A Banerjee, Kaustav
%T Thermal Effects in Deep Sub-Micron VLSI Interconnects and Implications for Reliability and Performance
%I EECS Department, University of California, Berkeley
%D 1999
%@ UCB/ERL M99/48
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1999/3739.html
%F Banerjee:M99/48