Technology Trend: Impact of Process Variations on Circuit Performance

T. Chien

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M03/37

2003

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http://www2.eecs.berkeley.edu/Pubs/TechRpts/2003/Archive/ERL-03-37.pdf

BibTeX citation:

@techreport{Chien:M03/37,
    Author= {Chien, T.},
    Title= {Technology Trend: Impact of Process Variations on Circuit Performance},
    Year= {2003},
    Month= {Sep},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2003/4163.html},
    Number= {UCB/ERL M03/37},
}

EndNote citation:

%0 Report
%A Chien, T. 
%T Technology Trend: Impact of Process Variations on Circuit Performance
%I EECS Department, University of California, Berkeley
%D 2003
%@ UCB/ERL M03/37
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2003/4163.html
%F Chien:M03/37