Technology Trend: Impact of Process Variations on Circuit Performance
T. Chien
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M03/37
, 2003
http://www2.eecs.berkeley.edu/Pubs/TechRpts/2003/ERL-03-37.pdf
BibTeX citation:
@techreport{Chien:M03/37, Author= {Chien, T.}, Title= {Technology Trend: Impact of Process Variations on Circuit Performance}, Year= {2003}, Month= {Sep}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2003/4163.html}, Number= {UCB/ERL M03/37}, }
EndNote citation:
%0 Report %A Chien, T. %T Technology Trend: Impact of Process Variations on Circuit Performance %I EECS Department, University of California, Berkeley %D 2003 %@ UCB/ERL M03/37 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2003/4163.html %F Chien:M03/37