Characterization of the Critical Dimension Error Budget for Extreme Ultraviolet Lithography
Jason P. Cain
EECS Department, University of California, Berkeley
2004
Advisors: Costas J. Spanos
BibTeX citation:
@phdthesis{Cain:8488, Author= {Cain, Jason P.}, Title= {Characterization of the Critical Dimension Error Budget for Extreme Ultraviolet Lithography}, School= {EECS Department, University of California, Berkeley}, Year= {2004}, }
EndNote citation:
%0 Thesis %A Cain, Jason P. %T Characterization of the Critical Dimension Error Budget for Extreme Ultraviolet Lithography %I EECS Department, University of California, Berkeley %D 2004 %F Cain:8488