Modeling Innovations in EUV and Nanoimprint Lithography
Yunfei Deng
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M05/27
, 2005
http://www2.eecs.berkeley.edu/Pubs/TechRpts/2005/ERL-05-27.pdf
BibTeX citation:
@techreport{Deng:M05/27, Author= {Deng, Yunfei}, Title= {Modeling Innovations in EUV and Nanoimprint Lithography}, Year= {2005}, Month= {Jun}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2005/28948.html}, Number= {UCB/ERL M05/27}, }
EndNote citation:
%0 Report %A Deng, Yunfei %T Modeling Innovations in EUV and Nanoimprint Lithography %I EECS Department, University of California, Berkeley %D 2005 %@ UCB/ERL M05/27 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2005/28948.html %F Deng:M05/27