MEMS-Based System for Particle Exposure Assessment Using Thin-Film Bulk Acoustic Wave Resonators and IR / UV Optical Discrimination
Justin Phelps Black
EECS Department, University of California, Berkeley
Technical Report No. UCB/EECS-2006-193
December 22, 2006
http://www2.eecs.berkeley.edu/Pubs/TechRpts/2006/EECS-2006-193.pdf
Advisors: Richard M. White
BibTeX citation:
@phdthesis{Black:EECS-2006-193, Author= {Black, Justin Phelps}, Title= {MEMS-Based System for Particle Exposure Assessment Using Thin-Film Bulk Acoustic Wave Resonators and IR / UV Optical Discrimination}, School= {EECS Department, University of California, Berkeley}, Year= {2006}, Month= {Dec}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2006/EECS-2006-193.html}, Number= {UCB/EECS-2006-193}, }
EndNote citation:
%0 Thesis %A Black, Justin Phelps %T MEMS-Based System for Particle Exposure Assessment Using Thin-Film Bulk Acoustic Wave Resonators and IR / UV Optical Discrimination %I EECS Department, University of California, Berkeley %D 2006 %8 December 22 %@ UCB/EECS-2006-193 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2006/EECS-2006-193.html %F Black:EECS-2006-193