Haryadi Gunawi and Thanh Do and Pallavi Joshi and Joseph M. Hellerstein and Andrea Arpaci-Dusseau and Remzi Arpaci-Dusseau and Koushik Sen

EECS Department, University of California, Berkeley

Technical Report No. UCB/EECS-2010-97

June 16, 2010

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2010/EECS-2010-97.pdf

Recent data-loss incidents have shown that existing large distributed systems are still vulnerable to failures. To improve the situation, we propose two new testing approaches: failure testing service (FTS) and declarative testing specification (DTS). FTS enables us to systematically push a system into thousands of failure scenarios, leading us to many critical recovery bugs. With DTS, we introduce "micro-specifications", clear and concise specifications written in Datalog style, which enables developers to easily write, refine, and manage potentially hundreds of specifications.

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BibTeX citation:

@techreport{Gunawi:EECS-2010-97,
    Author= {Gunawi, Haryadi and Do, Thanh and Joshi, Pallavi and Hellerstein, Joseph M. and Arpaci-Dusseau, Andrea and Arpaci-Dusseau, Remzi and Sen, Koushik},
    Title= {Towards Automatically Checking Thousands of Failures with Micro-specifications},
    Year= {2010},
    Month= {Jun},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2010/EECS-2010-97.html},
    Number= {UCB/EECS-2010-97},
    Abstract= {Recent data-loss incidents have shown that existing
large distributed systems are still vulnerable to
failures.  To improve the situation, we propose two
new testing approaches: failure testing service
(FTS) and declarative testing specification (DTS).
FTS enables us to systematically push a system into
thousands of failure scenarios, leading us to many
critical recovery bugs.  With DTS, we introduce
"micro-specifications", clear and concise
specifications written in Datalog style, which
enables developers to easily write, refine, and
manage potentially hundreds of specifications.},
}

EndNote citation:

%0 Report
%A Gunawi, Haryadi 
%A Do, Thanh 
%A Joshi, Pallavi 
%A Hellerstein, Joseph M. 
%A Arpaci-Dusseau, Andrea 
%A Arpaci-Dusseau, Remzi 
%A Sen, Koushik 
%T Towards Automatically Checking Thousands of Failures with Micro-specifications
%I EECS Department, University of California, Berkeley
%D 2010
%8 June 16
%@ UCB/EECS-2010-97
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2010/EECS-2010-97.html
%F Gunawi:EECS-2010-97