Steven Bailey

EECS Department
University of California, Berkeley
Technical Report No. UCB/EECS-2014-233
December 19, 2014

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/EECS-2014-233.pdf

Advisor: Borivoje Nikolic

BibTeX citation:

@mastersthesis{Bailey:EECS-2014-233,
    Author = {Bailey, Steven},
    Editor = {Nikolic, Borivoje},
    Title = {Modeling Radiation-Induced Soft Errors in Logic and the Overhead of Resiliency Techniques},
    School = {EECS Department, University of California, Berkeley},
    Year = {2014},
    Month = {Dec},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/EECS-2014-233.html},
    Number = {UCB/EECS-2014-233}
}

EndNote citation:

%0 Thesis
%A Bailey, Steven
%E Nikolic, Borivoje
%T Modeling Radiation-Induced Soft Errors in Logic and the Overhead of Resiliency Techniques
%I EECS Department, University of California, Berkeley
%D 2014
%8 December 19
%@ UCB/EECS-2014-233
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/EECS-2014-233.html
%F Bailey:EECS-2014-233