Steven Bailey

EECS Department, University of California, Berkeley

Technical Report No. UCB/EECS-2014-233

December 19, 2014

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/EECS-2014-233.pdf

Advisors: Borivoje Nikolic

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BibTeX citation:

@mastersthesis{Bailey:EECS-2014-233,
    Author= {Bailey, Steven},
    Editor= {Nikolic, Borivoje},
    Title= {Modeling Radiation-Induced Soft Errors in Logic and the Overhead of Resiliency Techniques},
    School= {EECS Department, University of California, Berkeley},
    Year= {2014},
    Month= {Dec},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/EECS-2014-233.html},
    Number= {UCB/EECS-2014-233},
}

EndNote citation:

%0 Thesis
%A Bailey, Steven 
%E Nikolic, Borivoje 
%T Modeling Radiation-Induced Soft Errors in Logic and the Overhead of Resiliency Techniques
%I EECS Department, University of California, Berkeley
%D 2014
%8 December 19
%@ UCB/EECS-2014-233
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/EECS-2014-233.html
%F Bailey:EECS-2014-233