Modeling Radiation-Induced Soft Errors in Logic and the Overhead of Resiliency Techniques

Steven Bailey

EECS Department, University of California, Berkeley

Technical Report No. UCB/EECS-2014-233

December 19, 2014

This publication is archived. It is kept only for reference purposes, so it is no longer being updated and may not meet accessibility standards. If you need this content in a different format, please email webteam@eecs.berkeley.edu.

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/Archive/EECS-2014-233.pdf

Advisors: Borivoje Nikolic

BibTeX citation:

@mastersthesis{Bailey:EECS-2014-233,
    Author= {Bailey, Steven},
    Editor= {Nikolic, Borivoje},
    Title= {Modeling Radiation-Induced Soft Errors in Logic and the Overhead of Resiliency Techniques},
    School= {EECS Department, University of California, Berkeley},
    Year= {2014},
    Month= {Dec},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/EECS-2014-233.html},
    Number= {UCB/EECS-2014-233},
}

EndNote citation:

%0 Thesis
%A Bailey, Steven 
%E Nikolic, Borivoje 
%T Modeling Radiation-Induced Soft Errors in Logic and the Overhead of Resiliency Techniques
%I EECS Department, University of California, Berkeley
%D 2014
%8 December 19
%@ UCB/EECS-2014-233
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/EECS-2014-233.html
%F Bailey:EECS-2014-233