Colin Scott
EECS Department
University of California, Berkeley
Technical Report No. UCB/EECS-2014-57
May 8, 2014
http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/EECS-2014-57.pdf
Software bugs are inevitable in software-defined networking control software, and troubleshooting is a tedious, time-consuming task. In this thesis we discuss how to improve control software troubleshooting by presenting a technique for automatically identifying a minimal sequence of inputs responsible for triggering a given bug, without making assumptions about the language or instrumentation of the software under test. We apply our technique to five open source SDN control platforms---Floodlight, NOX, POX, Pyretic, ONOS---and illustrate how the minimal causal sequences our system found aided the troubleshooting process.
Advisor: Scott Shenker
BibTeX citation:
@mastersthesis{Scott:EECS-2014-57, Author = {Scott, Colin}, Title = {Troubleshooting Blackbox SDN Control Software With Minimal Causal Sequences}, School = {EECS Department, University of California, Berkeley}, Year = {2014}, Month = {May}, URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/EECS-2014-57.html}, Number = {UCB/EECS-2014-57}, Abstract = {Software bugs are inevitable in software-defined networking control software, and troubleshooting is a tedious, time-consuming task. In this thesis we discuss how to improve control software troubleshooting by presenting a technique for automatically identifying a minimal sequence of inputs responsible for triggering a given bug, without making assumptions about the language or instrumentation of the software under test. We apply our technique to five open source SDN control platforms---Floodlight, NOX, POX, Pyretic, ONOS---and illustrate how the minimal causal sequences our system found aided the troubleshooting process.} }
EndNote citation:
%0 Thesis %A Scott, Colin %T Troubleshooting Blackbox SDN Control Software With Minimal Causal Sequences %I EECS Department, University of California, Berkeley %D 2014 %8 May 8 %@ UCB/EECS-2014-57 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2014/EECS-2014-57.html %F Scott:EECS-2014-57