Advanced High-Frequency Measurement Techniques for Electrical and Biological Characterization in CMOS

Jun-Chau Chien and Ali Niknejad

EECS Department
University of California, Berkeley
Technical Report No. UCB/EECS-2017-9
May 1, 2017

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-9.pdf

Advisor: Ali Niknejad


BibTeX citation:

@phdthesis{Chien:EECS-2017-9,
    Author = {Chien, Jun-Chau and Niknejad, Ali},
    Title = {Advanced High-Frequency Measurement Techniques for Electrical and Biological Characterization in CMOS},
    School = {EECS Department, University of California, Berkeley},
    Year = {2017},
    Month = {May},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-9.html},
    Number = {UCB/EECS-2017-9}
}

EndNote citation:

%0 Thesis
%A Chien, Jun-Chau
%A Niknejad, Ali
%T Advanced High-Frequency Measurement Techniques for Electrical and Biological Characterization in CMOS
%I EECS Department, University of California, Berkeley
%D 2017
%8 May 1
%@ UCB/EECS-2017-9
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-9.html
%F Chien:EECS-2017-9