Advanced High-Frequency Measurement Techniques for Electrical and Biological Characterization in CMOS
Jun-Chau Chien and Ali Niknejad
EECS Department, University of California, Berkeley
Technical Report No. UCB/EECS-2017-9
May 1, 2017
http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-9.pdf
Advisors: Ali Niknejad
BibTeX citation:
@phdthesis{Chien:EECS-2017-9, Author= {Chien, Jun-Chau and Niknejad, Ali}, Title= {Advanced High-Frequency Measurement Techniques for Electrical and Biological Characterization in CMOS}, School= {EECS Department, University of California, Berkeley}, Year= {2017}, Month= {May}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-9.html}, Number= {UCB/EECS-2017-9}, }
EndNote citation:
%0 Thesis %A Chien, Jun-Chau %A Niknejad, Ali %T Advanced High-Frequency Measurement Techniques for Electrical and Biological Characterization in CMOS %I EECS Department, University of California, Berkeley %D 2017 %8 May 1 %@ UCB/EECS-2017-9 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2017/EECS-2017-9.html %F Chien:EECS-2017-9