Deep learing for single-shot autofocus microscopy
Henry Pinkard and Zachary Phillips and Arman Babakhani and Daniel Fletcher and Laura Waller
EECS Department, University of California, Berkeley
Technical Report No. UCB/EECS-2019-138
October 16, 2019
http://www2.eecs.berkeley.edu/Pubs/TechRpts/2019/EECS-2019-138.pdf
Maintaining an in-focus image over long time scales is an essential and non-trivial task for a variety of microscopy applications. Here, we describe a fast and robust auto-focusing method that is compatible with a wide range of existing microscopes. It requires only the addition of one or a few off-axis illumination sources (e.g. LEDs), and can predict the focus correction from a single image with this illumination. We designed a neural network architecture, the fully connected Fourier neural network (FCFNN), that exploits an understanding of the physics of the illumination in order to make accurate predictions with 2-3 orders of magnitude fewer learned parameters and less memory usage than existing state-of-the-art architectures, allowing it to be trained without any specialized hardware. We provide an open-source implementation of our method, in order to enable fast and inexpensive autofocus compatible with a variety of microscopes.
Advisors: Laura Waller
BibTeX citation:
@mastersthesis{Pinkard:EECS-2019-138, Author= {Pinkard, Henry and Phillips, Zachary and Babakhani, Arman and Fletcher, Daniel and Waller, Laura}, Title= {Deep learing for single-shot autofocus microscopy}, School= {EECS Department, University of California, Berkeley}, Year= {2019}, Month= {Oct}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2019/EECS-2019-138.html}, Number= {UCB/EECS-2019-138}, Abstract= {Maintaining an in-focus image over long time scales is an essential and non-trivial task for a variety of microscopy applications. Here, we describe a fast and robust auto-focusing method that is compatible with a wide range of existing microscopes. It requires only the addition of one or a few off-axis illumination sources (e.g. LEDs), and can predict the focus correction from a single image with this illumination. We designed a neural network architecture, the fully connected Fourier neural network (FCFNN), that exploits an understanding of the physics of the illumination in order to make accurate predictions with 2-3 orders of magnitude fewer learned parameters and less memory usage than existing state-of-the-art architectures, allowing it to be trained without any specialized hardware. We provide an open-source implementation of our method, in order to enable fast and inexpensive autofocus compatible with a variety of microscopes.}, }
EndNote citation:
%0 Thesis %A Pinkard, Henry %A Phillips, Zachary %A Babakhani, Arman %A Fletcher, Daniel %A Waller, Laura %T Deep learing for single-shot autofocus microscopy %I EECS Department, University of California, Berkeley %D 2019 %8 October 16 %@ UCB/EECS-2019-138 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2019/EECS-2019-138.html %F Pinkard:EECS-2019-138