Megumi Tanaka

EECS Department, University of California, Berkeley

Technical Report No. UCB/EECS-2023-66

May 5, 2023

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2023/EECS-2023-66.pdf

The development of cost-efficient, energy-efficient memory devices is of great interest. There is an urgent need for a large memory storage solution, which is simultaneously environmentally conscious. This project aims to understand how the crystal structure, or more specifically the disordering of the structure of a material, affects the magnitude of the spin-Hall effect. This is of great practical interest, especially in applications in magnetic random-access memory (MRAM), which is considered the leading contender for a less expensive, lower power memory device of the future. This report looks at the fabrication and measurement methods such as film deposition, resistivity measurements, XRD, TEM, and AFM, then analyzes the data that was acquired through the two fabrication and measurement cycles.

Advisors: Jeffrey Bokor and Frances Hellman

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BibTeX citation:

@mastersthesis{Tanaka:EECS-2023-66,
    Author= {Tanaka, Megumi},
    Title= {Amorphous Pt 1-x Ge x for Spintronics Applications: Growth and Characterization},
    School= {EECS Department, University of California, Berkeley},
    Year= {2023},
    Month= {May},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2023/EECS-2023-66.html},
    Number= {UCB/EECS-2023-66},
    Abstract= {The development of cost-efficient, energy-efficient memory devices is of great interest.  There is an urgent need for a large memory storage solution, which is simultaneously environmentally conscious.  This project aims to understand how the crystal structure, or more specifically the disordering of the structure of a material, affects the magnitude of the spin-Hall effect. This is of great practical interest, especially in applications in magnetic random-access memory (MRAM), which is considered the leading contender for a less expensive, lower power memory device of the future.  This report looks at the fabrication and measurement methods such as film deposition, resistivity measurements, XRD, TEM, and AFM, then analyzes the data that was acquired through the two fabrication and measurement cycles.},
}

EndNote citation:

%0 Thesis
%A Tanaka, Megumi 
%T Amorphous Pt 1-x Ge x for Spintronics Applications: Growth and Characterization
%I EECS Department, University of California, Berkeley
%D 2023
%8 May 5
%@ UCB/EECS-2023-66
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2023/EECS-2023-66.html
%F Tanaka:EECS-2023-66