Characterization and Measurement of 1/f Noise in MOS-LSI NMOS Devices

Chorng-Kuang Wang

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M79/78
December 1979

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1979/ERL-m-79-78.pdf

BibTeX citation:

@techreport{Wang:M79/78,
    Author = {Wang, Chorng-Kuang},
    Title = {Characterization and Measurement of 1/f Noise in MOS-LSI NMOS Devices},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1979},
    Month = {Dec},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1979/28963.html},
    Number = {UCB/ERL M79/78}
}

EndNote citation:

%0 Report
%A Wang, Chorng-Kuang
%T Characterization and Measurement of 1/f Noise in MOS-LSI NMOS Devices
%I EECS Department, University of California, Berkeley
%D 1979
%@ UCB/ERL M79/78
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1979/28963.html
%F Wang:M79/78