Chorng-Kuang Wang

EECS Department, University of California, Berkeley

Technical Report No. UCB/ERL M79/78

, 1979

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1979/ERL-m-79-78.pdf

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BibTeX citation:

@techreport{Wang:M79/78,
    Author= {Wang, Chorng-Kuang},
    Title= {Characterization and Measurement of 1/f Noise in MOS-LSI NMOS Devices},
    Year= {1979},
    Month= {Dec},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1979/28963.html},
    Number= {UCB/ERL M79/78},
}

EndNote citation:

%0 Report
%A Wang, Chorng-Kuang 
%T Characterization and Measurement of 1/f Noise in MOS-LSI NMOS Devices
%I EECS Department, University of California, Berkeley
%D 1979
%@ UCB/ERL M79/78
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1979/28963.html
%F Wang:M79/78