Zhendong Su

EECS Department, University of California, Berkeley

Technical Report No. UCB/CSD-97-969

, 1997

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/CSD-97-969.pdf

Relay Ladder Logic (RLL) is a programming language widely used for complex embedded control applications such as manufacturing and amusement park rides. The cost of bugs in RLL programs is extremely high, often measured in millions of dollars (for shutting down a factory) or human safety (for rides). In this paper, we describe our experience in applying constraint-based program analysis techniques to analyze production RLL programs. We demonstrate that our analyses are useful in detecting some common programming mistakes and can be easily extended to perform other kinds of analysis for RLL programs such as some of the analyses described in Barrett's Ladder Logic Analysis Survey.

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BibTeX citation:

@techreport{Su:CSD-97-969,
    Author= {Su, Zhendong},
    Title= {Automatic Analysis of Relay Ladder Logic Programs},
    Year= {1997},
    Month= {Sep},
    Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/5841.html},
    Number= {UCB/CSD-97-969},
    Abstract= {Relay Ladder Logic (RLL) is a programming language widely used for complex embedded control applications such as manufacturing and amusement park rides. The cost of bugs in RLL programs is extremely high, often measured in millions of dollars (for shutting down a factory) or human safety (for rides). In this paper, we describe our experience in applying constraint-based program analysis techniques to analyze production RLL programs.  We demonstrate that our analyses are useful in detecting some common programming mistakes and can be easily extended to perform other kinds of analysis for RLL programs such as some of the analyses described in Barrett's Ladder Logic Analysis Survey.},
}

EndNote citation:

%0 Report
%A Su, Zhendong 
%T Automatic Analysis of Relay Ladder Logic Programs
%I EECS Department, University of California, Berkeley
%D 1997
%@ UCB/CSD-97-969
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/5841.html
%F Su:CSD-97-969