The economic impact of metrology methods in semiconductor manufacturing
Payman Jula
EECS Department, University of California, Berkeley
Technical Report No. UCB/ERL M01/22
, 2001
http://www2.eecs.berkeley.edu/Pubs/TechRpts/2001/ERL-01-22.pdf
BibTeX citation:
@mastersthesis{Jula:M01/22, Author= {Jula, Payman}, Title= {The economic impact of metrology methods in semiconductor manufacturing}, School= {EECS Department, University of California, Berkeley}, Year= {2001}, Month= {May}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2001/9583.html}, Number= {UCB/ERL M01/22}, }
EndNote citation:
%0 Thesis %A Jula, Payman %T The economic impact of metrology methods in semiconductor manufacturing %I EECS Department, University of California, Berkeley %D 2001 %@ UCB/ERL M01/22 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2001/9583.html %F Jula:M01/22