Building a Better Backtrace: Techniques for Postmortem Program Analysis
Ben Liblit and Alex Aiken
EECS Department, University of California, Berkeley
Technical Report No. UCB/CSD-02-1203
, 2002
http://www2.eecs.berkeley.edu/Pubs/TechRpts/2002/CSD-02-1203.pdf
After a program has crashed, it can be difficult to reconstruct why the failure occurred, or what actions led to the error. We propose a family of analysis techniques that use the evidence left behind by a failed program to build a time line of its possible actions from launch through termination. Our design can operate with zero run time instrumentation, or can flexibly incorporate a wide variety of artifacts such as stack traces and event logs for increased precision. Efficient demand-driven algorithms are provided, and the approach is well suited for incorporation into interactive debugging support tools.
BibTeX citation:
@techreport{Liblit:CSD-02-1203, Author= {Liblit, Ben and Aiken, Alex}, Title= {Building a Better Backtrace: Techniques for Postmortem Program Analysis}, Year= {2002}, Month= {Oct}, Url= {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2002/5763.html}, Number= {UCB/CSD-02-1203}, Abstract= {After a program has crashed, it can be difficult to reconstruct why the failure occurred, or what actions led to the error. We propose a family of analysis techniques that use the evidence left behind by a failed program to build a time line of its possible actions from launch through termination. Our design can operate with zero run time instrumentation, or can flexibly incorporate a wide variety of artifacts such as stack traces and event logs for increased precision. Efficient demand-driven algorithms are provided, and the approach is well suited for incorporation into interactive debugging support tools.}, }
EndNote citation:
%0 Report %A Liblit, Ben %A Aiken, Alex %T Building a Better Backtrace: Techniques for Postmortem Program Analysis %I EECS Department, University of California, Berkeley %D 2002 %@ UCB/CSD-02-1203 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2002/5763.html %F Liblit:CSD-02-1203